DFT advances, parallel test, and in-system testing drive toward higher efficiency on the test floor without sacrificing ...

Design for Test (DFT) managers often must make difficult and sometimes costly trade-offs between test implementation effort and manufacturing test cost. The traditional method for evaluating these ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Imec and Cadence now present a design-for-test (DFT) architecture and corresponding automatic test pattern generation (ATPG) approach. It is an extension of their previously announced logic-on-logic ...

The V500 DFT-focused engineering test system includes new features and options for a wider range of applications. It includes optional support for delay (ac) scan to 30 MHz; ...