But perhaps most important is the attention to memory issues in this release. Bun inventor Jared Sumner claims that the ...
Semiconductor IP platform provider Virage Logic has announced its third-generation Self-Test and Repair (STAR) Memory System. The third-generation STAR Memory System provides its predecessor's on-chip ...
Memory maker Virage Logic (Fremont, Calif.) is debuting a third-generation memory called STAR Memory System (self-test and repair). Although sole-sourcing may or may not be an advantage, the company ...
Generic test and repair approaches to embedded memory have hit their limit. Smaller feature sizes, such as 130 nm and 90 nm, have made it possible to embed multiple megabits of memory into a single ...
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