SANTA CLARA, Calif.--(BUSINESS WIRE)--Advantest Corporation (TSE: 6857, NYSE: ATE) announces that Test & Measurement World Magazine has awarded its prestigious 2012 Best in Test Award in the ...
Clare Instruments is offering its first tester that can be used to HiPOT/flash test electrical products with in-built internal circuitry while they are connected to an isolated power supply. Typical ...
T5835 More than Doubles Testing Speed to 5.4 Gbps, Providing High Throughput and Reducing Cost of Test TOKYO, Nov. 30, 2021 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest ...
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To capture market share in the fast-growing flash memory test segment, estimated to be more than $700 million in 2006, San Jose-based SoC test provider Teradyne Inc. said today it will acquire flash ...
TOKYO--(BUSINESS WIRE)--Advantest Corporation (TSE: 6857, NYSE: ATE) today announced the availability of two new solutions for next-generation NAND flash memory test: the T5773 for package test and ...
Designed to meet the measurement requirements of mainstream IC processes as well as those beyond 45 nm, the 4080 Series parametric test platform solves challenges ...
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